Request InfoRudolph Technologies Inc.An automated inspection system for 200- and 300-mm wafers has been released by Rudolph Technologies Inc. The WaferView provides macrodefect inspection of wafer surfaces at throughputs of >100 wafers per hour. The company says the system's proprietary full-color image processing detects 95% of photolithography defects and correctly classifies them 85% of the time. The WaferView has a library of classified defects and can be programmed with new defect classes, enabling users to customize defect detection.See full productRelated content from Photonics MediaPRODUCTSPromoted Content March 2024 IssueSimple, Affordable Vision SolutionDesigned for error proofing, identification, general inspection and robot guidance, BOA Spot XL vision sensors deliver the performance and capabilities to rival any product in its class. 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