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SCANNING MICROSCOPE

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Nanonics Imaging Ltd.
Nanonics Imaging Ltd. has released the MultiView 400, a modular scanning probe microscope with a free optical axis from above and below the sample. The device can be moved easily among standard upright and inverted optical host microscopes. It can be used with all standard silicon atomic force microscopy probes as well as with the company's thermocouple, electrical, nanopipette, nanoheater and coaxial probes. Scanning range in the Z-axis is 70 µm for imaging of tall structures or deep trenches. Embedded closed-loop sensors return the sample to a precise spot with 20-nm accuracy, unaffected by...See full product

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