Request InfoOcean Optics - Part of Ocean InsightOcean Optics Inc. is offering a line of turnkey metrology systems for thin-film measurement, plasma analysis and optics characterization. PlasCalc is an optical emission spectrometer and control system that monitors and controls plasma processes. SpecEl is an ellipsometry tool for analyzing the thickness of optical layers from 10 nm to 250 µm, and the LTP long-trace profilometer, an interferometric optical profiling instrument, performs absolute figure measurement of optical components up to 1500 mm in diameter. All are based on the company's miniature fiber optic spectroscopy...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra June 2023 IssueThin-Film Metrology SystemThe kSA XRF (X-ray fluorescence) tool from k-Space measures film thicknesses below 100 nanometers for applications in coated glass and solar panels. 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