Request InfoPerkinElmerThe LC-PolScope macro imaging system from Cambridge Research & Instrumentation (CRI) Inc. is designed to measure retardance and slow-axis orientation of a 40 × 30-mm sample in less than 3 s. The system provides a method for measuring and analyzing low-level birefringence in samples with 0.02-nm sensitivity. It automates the process of quantitative birefringence metrology, allowing the user to calculate retardance magnitude and orientation at every pixel within seconds. 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