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SCANNING MICROPROBE

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JEOL USA Inc.
The JAMP-9500F scanning Auger microprobe for high-resolution surface analysis of microareas from JEOL USA Inc. is suitable for identifying killer defects in interfaces and for analyzing coatings and composites. It achieves minimum probe diameters of 3 and 8 nm for secondary electron imaging and Auger imaging, respectively. Features include a neutralizing ion gun, a tilting specimen stage and a low-aberration objective lens. It incorporates a hemispherical energy analyzer that can vary energy resolution from 0.05% to 0.06%, and it can analyze smaller features of larger samples of up to 95 mm...See full product

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