Request InfoSemiconsoft Inc.Available from Semiconsoft Inc., TFCompanion 3.0 is a powerful software package for thin-film metrology applications, including semiconductors and biotechnology. This version fully supports imaging ellipsometry and reflectometry data analysis as well as image processing and analysis features for biochip applications. The software enables users to select feature sets relevant to their application requirements, and it now offers integrated data acquisition and control for spectrometers from Ocean Optics Inc. and Avantes Inc. It also supports measurement of thick, transparent substrates, such as...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra August 2023 IssueSemiconductor Metrology ToolThe FRT MicroProf® PT from FormFactor Inc. is a metrology and inspection system for high-throughput panel measurement in advanced packaging. 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