Search
Menu
PI Physik Instrumente - Revolution In Photonics Align ROSLB 3/24

JSM-7001F Analytical SEM

Facebook X LinkedIn Email
Request Info
JEOL USA Inc.
PEABODY, Mass., March 13, 2007 -- The JSM-7001F, a new thermal field-emission analytical scanning electron microscope (SEM) from electron optical product maker JEOL USA, acquires high-resolution micrographs at up to 1,000,000X magnification for applications ranging from semiconductors, metals, minerals, materials and ceramics to nonconductive biological samples. The JSM-7001F features a unique in-lens field emission gun that delivers more than 200 nA of beam current to the sample. An extremely small probe diameter at low kV and high current is optimal for characterization of nanostructures with a resolution of 1.2 nm at...See full product

Related content from Photonics Media



    PRODUCTS


    ARTICLES


    PHOTONICS HANDBOOK ARTICLES


    WHITEPAPERS


    WEBINARS


    PHOTONICS DICTIONARY+ TERMS


    VIDEOS


    PHOTONICS BUYERS' GUIDE CATEGORIES


    COMPANIES


    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.