Request InfoRigaku Americas Corp.THE WOODLANDS, Texas, Sept. 4, 2007 -- The Ultima IV x-ray diffractometer is an advanced general purpose x-ray diffraction (XRD) instrument for materials science, semiconductor, and nanotechnology research and development, as well as for manufacturing quality assurance applications, according to its maker, Rigaku Americas Corp. The design features a new high-speed detector for 100 times faster measurements, application flexibility provided by patented Cross Beam Optics (CBO), and a 50 percent smaller size than a conventional XRD system, the company said. A fully optioned Ultima IV can span applications that would have...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 7/3/2023Benchtop X-Ray Diffraction PlatformBruker’s D6 PHASER X-Ray Diffraction (XRD) system is a benchtop XRD platform designed with analytical flexibility typically only available in larger, floor-standing systems. 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