Request InfoThermo Fisher ScientificThermo Fisher Scientific Inc. has announced the ECO 3500 Fourier transform infrared metrology system, which integrates easily into automated wafer handling facilities. It incorporates a spectrometer, enhanced analytical software and a software interface that provides full SEMI E95-compliant access for process engineering, research and production-monitoring applications. Two in-line load ports and a high-precision edge grip stage improve wafer handling capabilities, accuracy and repeatability. The system uses an air-cooled infrared source and a beamsplitter mounted in a purged housing. It...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra June 2023 IssueThin-Film Metrology SystemThe kSA XRF (X-ray fluorescence) tool from k-Space measures film thicknesses below 100 nanometers for applications in coated glass and solar panels. 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