Request InfoVeeco Instruments Inc.Veeco Instruments Inc. has developed the HarmoniX atomic force microscope (AFM) technique by which users can simultaneously capture quantitative maps of material properties such as elasticity, adhesion, dissipation and peak force. It is available on all of the company’s scanning probe microscopes that are powered by the NanoScope V controller and probes. HarmoniX acquires real-time force curves by measuring the cantilever’s torsional motion each time the AFM tip interacts with the surface, and proprietary analyses instantly calculate sample characteristics and provide results in image maps...See full productRelated content from Photonics MediaPRODUCTSBioPhotonics Sep/Oct 2022 IssueSlide ScannerThe C13220-21MDEU NanoZoomer® S360MD slide scanner system from Hamamatsu is a high-throughput, in vitro diagnostic regulation-compliant model for use in hospitals and clinical laboratories. ...Photonics.com 5/11/2022Augmented Reality SystemThe SZX-AR1 augmented reality system from EVIDENT easily retrofits to existing Olympus SZX series stereo microscopes to simplify complex microscope-based manufacturing tasks and simplify assembler...BioPhotonics Mar/Apr 2024 IssueSuperresolution SIM MicroscopesThe Lattice SIM 3 and Lattice SIM 5 from ZEISS are superresolution microscopes that use structured illumination microscopy (SIM) to overcome the physical resolution limits of light microscopy. 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