Request InfoNikon Instruments Inc.The APM-3000 series automated pattern profile inspection device has been unveiled by Nikon Instruments Inc. Comprising an optical system with a polarizer and a high-numerical-aperture objective, it leverages a form of birefringence in a Fourier space to detect critical dimension and pattern edge roughness variations, which are detected as polarization fluctuations and converted by the polarizer into the light intensity.See full productRelated content from Photonics MediaWEBINARSPhotonics.com 10/27/2021Fiber Optic Solutions for Medical DevicesSteve Allen provides a brief overview and examples of procedures that continue to push adoption and proliferation of optical fiber-based medical devices. From cosmetic surgery to cutting-edge sensing...Photonics.com 7/20/2023Motorized and Calibrated Lenses for Machine Vision ApplicationsMany applications have benefited from motorized varifocal lenses that allow automatic or remote adjustment of focus distance and field of view. Applications may need to change the focal length or...Photonics.com 3/27/2024Precision Planning: Simplified Laser Scanning with Predictive SoftwareConventional controllers for laser scan systems do not allow to predict the actual path of the laser beam on the work piece. A tedious process of testing different parameters and delay settings...Photonics.com 1/12/2023A Proven, Portable, and PIC-Based Methodology for Cultivating a Next-Generation WorkforceWith the passage of the CHIPS and Science Act and growing demand for photonic integrated circuit technology, the semiconductor industry is once again gaining momentum. But even as the U.S. rebuilds...