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Lambda Research Optics, Inc. - Limited Time Offer

EUV Spectrometer

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McPHERSON
CHELMSFORD, Mass., Jan. 12, 2009 – McPherson Inc. has released an x-ray and extreme ultraviolet (EUV) spectrometer, the 251MX, for wavelength dispersive spectral measurements from 0.6 to 20 nm (60 to 2000 eV.) The device provides corrected flat-field spectra with its selection of diffraction gratings. Data is acquired quickly and easily with direct-detection CCDs. The clean stainless steel chamber and vacuum-prepared internal components enable efficient pumping for high- or ultrahigh-vacuum (UHV) applications. The small footprint simplifies systems integration. The two available gratings, for 0.6 to 6 nm and 5 to 20 nm have...See full product

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