Search
Menu
BAE Systems Sensor Solutions - Fairchild - Thermal Imaging Solutions 4/24 LB

JEM-ARM200F Microscope

Facebook X LinkedIn Email
Request Info
JEOL USA Inc.
PEABODY, Mass., March 12, 2009 – JEOL USA Inc. has introduced the JEM-ARM200F atomic resolution analytical microscope. The 200-kV spherical aberration-corrected scanning/transmission electron microscope (S/TEM) achieves a high angle annular dark-field resolution of 80 pm, or 0.08 nm. Maximum accelerating voltage is 200 kV, and maximum tilt angle is ±25°. With advanced analytical capabilities, the instrument enables both atom-by-atom imaging resolution and good spatial resolution for atom-to-atom chemical mapping of materials. The new electron column design integrates S/TEM with aberration correction for atomic spatial...See full product

Related content from Photonics Media



    PRODUCTS


    ARTICLES


    PHOTONICS HANDBOOK ARTICLES


    WHITEPAPERS


    WEBINARS


    PHOTONICS DICTIONARY+ TERMS


    VIDEOS


    PHOTONICS BUYERS' GUIDE CATEGORIES


    COMPANIES


    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.