Request InfoMalvern Panalytical Inc.PANalytical has launched the 2830 ZT, a wafer analyzer that performs simultaneous noncontact determination of layer thickness and composition on wafers up to 300 mm. The wavelength dispersive x-ray fluorescence instrument also determines contamination, dopant levels and surface uniformity, and it measures up to 24 elements on stacks of up to 16 layers. 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