Request InfoThin-film photovoltaic test systemCRAIC TechnologiesSAN DIMAS, Calif., July 13, 2009 – Craic Technologies Inc. has launched the QDI 2010 Film microspectrophotometer that measures the thickness of thin films of photovoltaic cells rapidly and nondestructively. It can analyze films of many materials on both transparent and opaque substrates and enables the user to determine thin-film thickness of even microscopic sampling areas. Materials include semiconductors, microelectromechanical systems devices, disk drives and flat panel displays. The device can be combined with proprietary contamination imaging capabilities and can test the transmissivity of photovoltaic cell...See full productRelated content from Photonics MediaPRODUCTSBioPhotonics Sep/Oct 2022 IssueMicrospectrophotometerThe FLEX PRO™ UV-VIS-NIR microspectrophotometer from CRAIC Technologies is a multifunctional tool able to acquire microscale images and spectra from the deep UV to the NIR. 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