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NT9080 Surface Metrology System

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Veeco Instruments Inc.
PLAINVIEW, N.Y., Feb. 2, 2010 – The NT9080 surface metrology system has been introduced by Veeco Instruments Inc. It uses white light interferometry to measure critical surface topography nondestructively, from nanometer-scale roughness through millimeter-scale steps, with subnanometer vertical resolution and production-level throughput. Push-button analysis provides instant feedback, and 3-D surface data is saved for subsequent characterization, without requiring a new scan of the sample or part. Used in research labs and in the precision machining, medical, printing, and solar cell manufacturing markets, the system can...See full product

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