Request InfoCRAIC TechnologiesSAN DIMAS, Calif., June 9, 2010 — Craic Technologies Inc. has announced the 20/20 Film microspectrophotometer that is designed to measure the thickness of thin films of submicron sampling areas rapidly and nondestructively. Able to analyze films of many materials on both transparent and opaque substrates, it enables the user to determine thin film thickness on semiconductors, microelectromechanical systems devices, hard disk drives and flat panel displays. The microspectrophotometer also can be configured for contamination imaging, analysis, concentration and relative intensity mapping. 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