Request Infopiezosystem jena GmbHJENA, Germany, April 20, 2011 — Piezosystem jena GmbH is offering the PXY AP low-profile flat and ultrafast piezo scanning stage. With its large clearance aperture, it enables the installation of diverse sample holders and other fixtures. For accurate scanning applications, two dedicated axis configurations are normally used: a fast axis with a long motion range, and a second axis performing small and precise steps on a line feed. The company has developed the VTR select feature, which makes it possible to combine various travel motion for different axes. Variable travel range selections from 24 to 700 µm for...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 2/29/20243D Measuring DeviceThe FocusX from Bruker Alicona is an optical 3D measuring device meant for applications where highly reflective surfaces, steep flanks, and complex forms must be measured. 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