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Bristol Instruments, Inc. - 872 Series High-Res 4/24 LB

FIB-SEM Workstation

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Carl Zeiss Microscopy GmbH, Electron- and Ion-Beam Microscopes
Carl Zeiss’ Auriga laser system combines the advantages of its Auriga CrossBeam focused ion beam/scanning electron microscope (FIB-SEM) workstation with the capabilities of a pulsed microfocus laser for fast ablation of materials. The laser is useful for examining samples where the target structure is buried under material layers that must be removed — a procedure difficult to conduct with conventional techniques. Mechanical ablation and cross-sectioning of large material volumes often cause deformations, making the sample unsuitable for further examination, and applying a...See full product

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