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Alluxa - Optical Coatings LB 8/23

Kelvin Probe Force Microscopy

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Bruker Nano Surfaces
Bruker Corp. has released the PeakForce Kelvin Probe Force Microscopy (KPFM) mode for its line of atomic force microscopes (AFMs). It uses frequency-modulation detection to provide high-spatial-resolution Kelvin probe data. It builds on proprietary PeakForce Tapping technology to provide directly correlated quantitative nanomechanical data, which improves the sensitivity of the frequency-modulation measurement and eliminates artifacts. PeakForce KPFM provides automated parameter setup with ScanAsyst, improving quantitative surface potential data for materials research and semiconductor...See full product

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