Request InfoZygo CorporationZygo Corp.’s Nexview 3-D imaging and surface metrology system offers subnanometer vertical resolution independent of magnification for the production and scientific research markets. Able to operate on slopes up to 85° and in high-vibration environments, the profiler conducts noncontact surface metrology on a variety of surfaces, from very smooth to very rough, and safely measures fragile and transparent materials without altering the test surface. 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