Ultratech Inc.SAN JOSE, Calif., Nov. 18, 2014 — A new optical in-line inspection system from Ultratech Inc. provides 3-D topographical information for producers of semiconductor wafers. The Superfast 4G uses proprietary coherent gradient-sensing technology to perform direct, front-side 3-D measurement for patterned wafers, with a throughput of up to 125 wafers per hour. Its open architecture is intended to improve laser lithography performance.See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra April 2024 IssueCompact VIS-SWIR CameraThe Emberion VS20 Compact from Emberion is a lightweight camera consisting of VGA resolution over a broad spectral range from visible to short-wave infrared wavelengths in room temperature operation....Photonics Spectra April 2024 IssueVisible Hyperspectral LEDThe COBRA™ HyperSpec Visible from ProPhotonix Limited is an LED light that focuses exclusively on the visible band between 400 and 700 nm. 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