Request InfoAnritsu Corp., Test & MeasurementONNA, Japan, Feb. 9, 2018 — Anritsu Corp. has introduced clock recovery, PAM4 analysis and jitter analysis options for its BERTWave MP2110A sampling oscilloscope tp help shorten inspection times, increase production-line yields and lower measurement equipment costs in 200/400-G high-speed optical module and device manufacturing environments. With the options installed, the BERTWave MP2110A can be used to evaluate physical layer performance of CFP2/4/8, QSFP28, SFP28, OSFP and QSFP-DD optical modules, active optical cables and optical devices. The new options augment the existing bit error rate measurement and EYE...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra October 2023 IssueHigh-Speed 3D Inspection SystemThe TR7700QH SII ultrahigh-speed 3D automated optical inspection solution from Test Research Inc. features a 15-µm resolution, 21-MP imaging, and large field-of-view capability. 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