Request InfoApre InstrumentsYes! With Spectrally Controlled Interferometry (SCI), you can electronically control the source coherence for fast setup in the “laser” mode, then switch to “white-light” mode to isolate the surface you want to measure — all the way down to 50-µm optical thickness. No more multiple surface interference that prohibits measurement. Contact us today or visit www.apre-inst.com/sci.See full productRelated content from Photonics MediaPRODUCTSPhotonics Showcase January 2024 IssueGHFLI SHFLI Lock-In AmplifiersBoost the measurement of microwave resonators and the realization of optical phase locked loops using the world’s first microwave lock-in amplifiers with PID controllers and PLLs. Track your...Photonics.com 4/26/2022Laser Power SensorThe Ophir® IPM-10KW laser power sensor from MKS Instruments Inc. delivers high accuracy and repeatable measurements in rough production environments. 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