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Next-Generation Metrology Facilitates Next-Generation Displays

Author: Peter Notermans and Nathan Cohen
Monday, November 28, 2016
Impressive advances in production technology have created high-density displays operating over wide color gamuts, but what is built must be tested, and improved production requires improved metrology. Color presents a particularly challenging metrology problem because even high-quality color cameras are not traceable to spectral standards. Spectrometers provide accurate color information but without the spatial resolution required to faithfully capture display color quality. As described in this article, the author’s team assembled an instrument that combines the strengths of both spectrometers and high-quality cameras to provide rapid and reliable metrology for color displays.
File: Next_Generation_Metrology_Facilitates_Next_Generation_Displays2.pdf (338.06 KB)
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