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Test & Measurement Products
WAVELENGTH METER
Sep 1, 2000 — The Q8326 optical wavelength meter from Tektronix Inc. tests laser diodes for use in telecommunications. It has a wavelength accuracy of ±2 ppm and resolution to 0.1 pm. The meter has a sampling rate of five measurements per second and a deviation display function that allows capture of wavelength fluctuations caused by variations in temperature. The Q8326 also can be employed as a wavelength standard for the calibration of optical spectrum analyzers and tunable lasers.
Tektronix Inc.
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FIBER SWITCHES
Aug 1, 2000 — Fiber optic switches are available from piezosystem jena GmbH for optical measurement, transmission technology and spectroscopy applications. The F-SM19 has one input channel and can be switched to nine channels of output. The F-SM16 has one to six...
piezosystem jena GmbH
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LASER POWER METER
Aug 1, 2000 — Ophir Optronics Inc. has introduced a meter for measuring the power of static and scanned laser beams with up to 20 mW of average power. The BC20 scans up to 30,000 in./s with NIST-traceable accuracy to -5%. The standard model is calibrated for...
MKS Ophir, Light & Measurement
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MEASURING DISPLACEMENT
Aug 1, 2000 — The LaserMax DMI 500 is a displacement measuring interferometer for machine tool control and calibration, integrated circuit wafer processing and micropositioning. LaserMax Inc.'s device is capable of 0.083-µm resolution with a range of 500...
LMD Power of Light Corp. dba LaserMaxDefense
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PICOSECOND DIODE LASER
Aug 1, 2000 — The PDL 800 is suitable for time-resolved fluorescence spectroscopy, fiber-based distributed temperature measurement, wafer inspection systems, time-response characterization of optoelectronic devices and optical tomography of biological tissue....
PicoQuant GmbH
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POLARIZATION EXTINCTION RATIOMETER
Aug 1, 2000 — Santec Europe Ltd. offers a device for measuring polarization extinction ratio, optical power and polarization angle in real time. The PEM-310 simultaneously displays the measurements on the front panel and can output the results via a...
Santec Corp.
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PROCESS PHOTOMETER
Jul 1, 2000 — Providing rapid sequential measurements with up to eight probes, the ChemViewMx allows measurements in the UV, VIS and NIR with one analyzer. One probe from the fiber optic-based process photometer measures aromatic stripping at 254 nm, a second...
Synopsys Inc., Optical Solutions Group
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SIGNAL ANALYZER
Jul 1, 2000 — Anritsu Co.'s portable analyzer can measure SONET, SDH, PDH and ATM for use during the R&D and manufacture of optical circuits, as well as during the installation and maintenance of fiber networks. The MP1570A modular analyzer can measure signal...
Anritsu Co.
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SPECTROPHOTOMETER
Jul 1, 2000 — PerkinElmer Instruments has introduced a UV/VIS spectrophotometer with a low-noise photomultiplier and a demountable sample compartment. The Lambda 800 double-beam, double-monochromator system has a range from 175 to 900 nm and performs...
PerkinElmer Instruments
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EDFA/DWDM TEST AND MEASUREMENT INSTRUMENT
Jun 1, 2000 — ILX Lightwave Corp. offers the FTS-9200 high-density comb source for the test and measurement of erbium-doped fiber amplifiers and dense wavelength division multiplexers. It features up to 48 distributed feedback source modules in one instrument...
Newport - ILX Lightwave, Photonics
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PHOTON COUNTER
Jun 1, 2000 — Two digital photon counting systems from C&L Instruments connect to transistor-transistor-logic-output photomultiplier tube modules for performing low-light intensity measurements. The systems include a plug-and-play ISA PC card and software,...
C & L Instruments Inc.
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UV DOSE MEASUREMENT
Jun 1, 2000 — The Con-Trol-Cure Rad Check system from UV Process Supply Inc. can measure UV energy doses from curing systems that are inaccessible to conventional radiometers. Designed for web offset, flexo, CD/DVD and 3-D screen environments, the system produces...
UV Process Supply Inc.
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FIBER OPTIC TEST
May 1, 2000 — The FOS 79800C/315SB and FOS 79800C/315SL high-power WDM distributed feedback modules have been unveiled by ILX Lightwave Corp. They deliver at least 20 mW of stable laser power at any specified wavelength from 1528 to 1610 nm. The devices offer...
Newport - ILX Lightwave, Photonics
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LASER MEASUREMENT
May 1, 2000 — The LK series charge-coupled device laser displacement meter has been developed for surface profiling and for measurement of thickness, height, position and size of metals and other materials. Available from Keyence Corp. of America, the instrument...
Keyence Corp.
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LASER POWER METER
May 1, 2000 — Ophir Optronics Inc. has introduced a laser power meter that supports more than 50 thermal heads in the microwatt to 20-kW range. The Orion/TH's 32 x 122-pixel graphics on a Supertwist LCD with electroluminescent backlight and Soft Keys guide users...
MKS Ophir, Light & Measurement
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DIODE LASER
Apr 1, 2000 — The Tec 500 Littman laser is suitable for molecular spectroscopy, metrology, injection seeding, and atom cooling and trapping. Sacher Lasertechnik designed the tunable, external cavity diode laser to synchronize the grating- and cavity-defined...
Sacher Lasertechnik GmbH
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MULTIWAVELENGTH METER
Apr 1, 2000 — With a wavelength accuracy of ±0.003 nm, the FTB-5320 multiwavelength meter measures wavelength and power variation in the C- and L-bands and provides a real-time graphical representation of wavelength drift. Exfo Electro-Optical Engineering...
EXFO Inc.
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SPECTROPHOTOMETERS
Apr 1, 2000 — Secomam has released Prim Light and Prim Advanced UV-VIS spectrophotometers for laboratory applications. The Prim Light offers a range of 330 to 900 nm for a 10-nm bandwidth, making it suitable for routine measurements. The Advanced model is...
Secomam
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LASER ERROR MAPPING
Mar 1, 2000 — The 6-D HP laser measuring system from Automated Precision Inc. simultaneously maps six possible positioning errors of a coordinate measurement machine and other metrology instruments. The system error-maps linear displacement in the direction of...
Automated Precision Inc. (API)
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POSITION MEASUREMENT
Mar 1, 2000 — The LPM series of laser position monitors from Laser Components GmbH determines the position of an object perpendicular to the laser beam with a possible resolution of 1 µm. The transmitter and receiver are separate units that may be arranged...
Laser Components Germany GmbH
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LARGE-AREA NONCONTACT SURFACE MEASUREMENT
Feb 1, 2000 — The OSP500LM noncontact surface profiling, measurement and gauging instrument from Uniscan Instruments Ltd. is designed for high-speed metrology applications where surface measurement at the micron level is required over areas up to 500 x 500 mm....
Uniscan Instruments Ltd.
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INTERFEROMETER FOR FTIR SPECTROSCOPY
Jan 1, 2000 — PLX Inc. has developed an interferometer for FTIR spectroscopy. The single monolithic structure contains two mirrors and a beamsplitter fused with top and bottom glass plates of the same material. The uniform coefficient of thermal expansion of the...
PLX Inc.
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MINI OPTICAL TIME-DOMAIN REFLECTOMETERS
Jan 1, 2000 — The MW9076 family of miniature optical time-domain reflectometers (OTDR) from Anritsu Co. display measurement results in 10 s and have a sampling speed of 0.15 s. The dynamic range of the four models in this family range from 34 to 45 dB. The...
Anritsu Co.
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OPTICAL FIBER ANALYZER
Jan 1, 2000 — Exfo Inc.'s NR-9200 optical fiber analyzer performs refractive index profile and geometric analyses on single- and multimode fibers. For core and cladding analysis, it measures concentricity error, noncircularity and numerical aperture, and computes...
EXFO Inc.
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SPECTRORADIOMETER
Nov 1, 1999 — Analytical Spectral Devices Inc. has introduced its FieldSpec Pro portable spectroradiometer. The instrument measures 13 x 4.5 x 16 in., weighs 16 lb and mounts on a backpack for transport. It offers spectral resolution of 3 nm at 700 nm and 10 nm...
ASD Inc.
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May 2024
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