SAN FRANCISCO, Jan. 23 -- AngstroVision Inc. is developing a new nano-imaging device to target characterization and metrology applications in the materials and information technology markets. This new technology creates 3-D images with resolutions in the range of several nanometers that can be acquired at high speeds in a wide range of environments, AngstroVision said, and it eliminates the need for preparation of samples or destruction of samples. The company plans to ship its first product in 2004. For more information, visit: www.angstrovision.comRead full articleRelated content from Photonics MediaArticlesHigh-Efficiency Frequency Comb Invites Range of Optical EndeavorsOn-chip laser frequency combs are a promising technology for applications including environmental monitoring, optical computing, astronomy, and metrology. 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