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When the Chips Are Down, It's Microscopy to the Rescue

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Hank Hogan, Contributing Editor

Integrated circuits are modern miracles, cramming tens of millions of transistors into thumbnail-size chips. But there’s a dark lining to this silver cloud — one that a terahertz microscopy technique under investigation by scientists at Okayama University, Osaka University and Riken research institute in Wako, Japan, could play a part in illuminating. As with other manufactured goods, integrated circuits can have defects; for example, when a connecting trace breaks or a particle is contaminated. The challenge is to find and identify the offender. That’s difficult to do, given the...Read full article

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    Published: February 2005
    chipsFeaturesindustrialintegrated circuitsMicroscopyOkayama UniversityOsaka UniversitySensors & Detectorstransistors

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