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  • 4D Technology Earns 3rd R&D 100 Award
Jul 2006
TUCSON, Ariz., July 12, 2006 -- 4D Technology Corp. announced today that for the third year in a row, one of its products has been selected as a recipient of the R&D 100 Award, presented annually by Chicago-based R&D Magazine to the 100 most innovative and technologically significant products of the past year.

4D's winning product this year is the SpeckleCam, a polarization-based electronic speckle pattern interferometer that combines two distinctive technologies to facilitate vibration-insensitive, high-precision phase measurements of meter-class diffuse surfaces. Utilizing 4D's patented instantaneous phase sensor technology, the SpeckleCam can aid in the detection of defects in safety critical flight hardware, enhance the quality control of manufactured parts and provide scientists with a new tool to investigate the properties of materials under extreme environmental conditions.

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An instrument that employs the interference of lightwaves to measure the accuracy of optical surfaces; it can measure a length in terms of the length of a wave of light by using interference phenomena based on the wave characteristics of light. Interferometers are used extensively for testing optical elements during manufacture. Typical designs include the Michelson, Twyman-Green and Fizeau interferometers. The basic interferometer components are a light source, a beamsplitter, a reference...
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