Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
SPECIAL ANNOUNCEMENT
2016 Photonics Buyers' Guide Clearance! – Use Coupon Code FC16 to save 60%!
share
Email Facebook Twitter Google+ LinkedIn Comments

Method Measures Heat of Thin-Film Semiconductors

Photonics Spectra
Feb 1999
With their complexity and materials changing, integrated circuits are generating more heat, creating a greater need to monitor that heat to improve efficiency and reliability. Researchers are measuring the thermal properties of various thin-film semiconducting materials, which differ significantly from the properties of bulk material.

A group led by Peter Raad, a professor of mechanical engineering at Southern Methodist University in Dallas, built a probing station that includes a microscope -- accurate to the submicron range -- and a series of fiber optic lasers. Wafers are heated by a laser pulsed for a few nanoseconds. A second laser probes the surface of the material to capture how it dissipates heat, helping researchers to determine the thin film's thermal properties using mathematical formulas.


Comments
Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2016 Photonics Media
x Subscribe to Photonics Spectra magazine - FREE!