Teradyne, located in North Reading, Mass., announced the signing of an exclusive development agreement with Teseda Corp. to produce Scan Workbench, a next-generation portable scan debug and yield enhancement tool. Based on industry-standard data protocols and the existing Teseda Workbench and Diagnostic Manager products, Scan Workbench will allow test engineers to better perform rapid silicon debug, design validation, failure analysis and yield monitoring. Scan Workbench provides a consistent debug and optimization environment based on IEEE 1450.0-1999 Standard Test Interface Language and the new STDF V4-2007 datalog standards. The software will initially be deployed on the Teradyne FLEX and J750 platforms, which will provide Scan Workbench with access to an installed base of more than 5,000 testers. The new tool set will ship in the second half of 2010.