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Keithley to Host Free Webinar on Characterization

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CLEVELAND, Ohio, April 26, 2010 — Keithley Instruments Inc., an advanced electrical test instruments and systems provider, announced it will broadcast a free, web-based seminar titled, “Fundamentals of Ultrafast I-V Device Characterization,” on April 29, 2010. The one-hour presentation will examine the importance of ultrafast current-voltage (I-V) characterization across a broad spectrum of device and process technologies. Common applications include non-volatile memory devices (NVM), like Flash and phase change memory, isothermal characterization on silicon-on-insulator (SOI) devices and compound...Read full article

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    Published: April 2010
    Glossary
    compound semiconductor
    A semiconductor made up of two or more elements, in contrast to those composed of a single element such as germanium or silicon. In a III-V semiconductor, for example, one or more elements having three valence electrons (gallium, for instance) are combined with one or more having five (arsenic).
    spectrum
    See optical spectrum; visible spectrum.
    AmericasbroadcastBusinesscommon error sourcecompound semiconductorcurrent voltageelectricalelectrical test instrumentengineerflash change memoryFundamentals of Ultrafast I-V Device Characterizationhardwarehigh-K dielectricsI-Visothermal characterizationKeithley InstrumentsLee Stauffermaterial reliability studiesmeasurement techniquenon-volatile memory deviceNVMphase change memorypresentationprobe stationsatellite communication systemsemiconductor fabricationsemiconductorsseminarsilicon-on-insulatorSOIspectrumTest & Measurementtransientultrafast current-voltagewebinar

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