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Photonics Handbook
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Superresolution Microscopy: An Imaging Revolution
MARIE FREEBODY, CONTRIBUTING EDITOR,
[email protected]
Superresolution optical microscopy, for which the Nobel Prize was awarded to Eric Betzig, Stefan Hell, and William Moerner in 2014, has been one of the most momentous developments in the life...
Measuring Surface Roughness: The Benefits of Laser Confocal Microscopy
ROBERT BELLINGER, Evident
When evaluating the surface of a component, surface roughness can be assessed by eye or by rubbing it with a fingertip. Common expressions include “shiny,” “lusterless and...
Nanopositioning: A Step Ahead
Scott Jordan, Brian Lula, and Stefan Vorndran, PI (Physik Instrumente) LP
By its original definition, a nanopositioning device is a mechanism capable of repeatedly delivering motion in increments as small as one nanometer. Lately demands from industry and research have...
Interferometry: Measuring with Light
Zygo Corporation
An interferometer is an instrument that compares the position or surface structure of two objects. The basic two-beam division of amplitude interferometer components consists of a light source, a...
Dynamic Interferometry: Getting Rid of the Jitters
John Hayes and James Millerd, 4D Technology Corporation
Conditions on the factory floor and in industrial cleanrooms with high-capacity air filtration systems can hamper the use of interferometry. Another problem is the testing of large-aperture mirrors...
Solid-State Lasers: Lower Noise Means Higher Performance
Kenneth Ibbs and Alex Laymon, DPSS Lasers, Inc.
Many linear materials proceseqsing applications call for lasers with continuous-wave (CW) output. For example, early stereolithography systems were based on CW lasers such as argon-ion or HeCd. To...
NSOM: Discovering New Worlds
M. Kovar, Midako A. Nohe, N.O. Petersen and P.R. Norton, University of Western Ontario
NSOM is suitable for studies on the mesoscopic scale (several tens to hundreds of molecular dimensions). It has become an important tool in research and applications of semiconductors, organic layers...
Spectrum Analysis for DWDM: New Instruments Meet the Challenge
Francis Audet, EXFO
As system and cable installers try to optimize their links, the preferred method has become high-speed DWDM. This demand for bandwidth has led to the development of new test and measurement...
SWIR Imaging: An Industrial Processing Tool
Sensors Unlimited Inc., A Collins Aerospace company
Imaging has long been used in industrial processes to measure, monitor, control, or otherwise manage the production of goods. The challenge to the process designer is to develop a tool that captures...
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