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18 products
Photonics Products
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3D microscopy x
NewView 3D Optical Profiler
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
Compass™ 2
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
ZeGage™ Pro
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
Nexview™ NX2 3D Optical Profiler
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
Contour Elite I
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Max Scan:
73 μm / sec
Max Scan Range:
≤10mm
Sample Height:
Up to 100 mm (4 in.)
NPFLEX
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Optical Resolution:
0.33 µm
RMS Reapeatability:
0.004 nm
Vertical Resolution:
<0.1 nm
Contour Elite K
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Max Scan:
47 μm/sec
Max Scan Range:
>10 mm
Sample Height:
Up to 100 mm
NanoScanZ Nanopositioning Piezo Z Stages
Prior Scientific Inc.
Type:
Nanopositioning Stage
Max. Load:
500g
Height:
21mm
Stage Type:
Motorized
Accuracy and Linearity:
0.5% of travel
Operating Temperature:
5-50 °C
Repeatability:
5 nm
S wide
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
Display Resolution:
0.001 µm
Max. Extended Measuring area:
300 × 300 mm
Vertical Measuring Range:
40 mm
S neox Five Axis
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
S neox
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
S mart
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
aplanoXX
AdlOptica GmbH
Type:
Optical
Magnification:
20X
Spectral Range:
VIS,NIR
Aberration Correction:
Collar
Clear Aperture:
20 mm
NA:
0.8
TopMap Micro.View+ 3D Optical Profiler
Polytec Inc.
Type:
Other
TopMap In.Line 3D Optical Profiler
Polytec Inc.
Type:
Other
TopMap Micro.View 3D Optical Profiler
Polytec Inc.
Type:
Other
SPINDLE
Double Helix Optics
Type:
Other
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
Type:
Scanning Probe
Photonics Products
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