Request InfoJEOL USA Inc.Nanometer-scale imaging is provid-ed by JEOL USA Inc.'s JSM-7400F scanning electron microscope. The device achieves 1.5-nm resolution at 1 kV. It features a patented scanning electron enhancer for improved contrast quality of surface structures, an r-filter for suppressing the electron charge on nonconductive specimens and an in-lens backscatter detector. Flexible analytical geometry enables a working distance of 8 mm at a takeoff angle of 35°. Load lock options allow coverage of samples up to 100, 150 or 200 mm in diameter, and three motorized eucentric stages with five-axis automation...See full productRelated content from Photonics MediaPRODUCTSBioPhotonics Jan/Feb 2024 IssueLaser Scanning MicroscopesEvident’s FLUOVIEW™ FV4000 confocal laser scanning microscope and FV4000MPE multiphoton laser scanning microscope, feature advancements in imaging technology that empower researchers to...BioPhotonics Jul/Aug 2022 IssuePhoton-Counting Sensor and CameraGigajot Technology Inc.’s QIS41 camera, built around the GJ04122 sensor, pairs well with standard 4/3-in. microscopy optics, bringing high resolution and low-light performance to scientific and...BioPhotonics Nov/Dec 2023 IssueFLIM Camera SystemThe LIFA vTAU from Lambert Instruments is a camera-based system designed to transform fluorescence lifetime imaging microscopy (FLIM) for live cell applications. 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