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SCANNING MICROSCOPE

Photonics Spectra
Jun 2004
Nanonics Imaging Ltd.Request Info
 
SCANNING MICROSCOPE Nanonics Imaging Ltd. has released the MultiView 400, a modular scanning probe microscope with a free optical axis from above and below the sample. The device can be moved easily among standard upright and inverted optical host microscopes. It can be used with all standard silicon atomic force microscopy probes as well as with the company's thermocouple, electrical, nanopipette, nanoheater and coaxial probes. Scanning range in the Z-axis is 70 µm for imaging of tall structures or deep trenches. Embedded closed-loop sensors return the sample to a precise spot with 20-nm accuracy, unaffected by hysteresis, creep, nonlinearity or aging of the piezoceramic. The system operates in contact, noncontact and intermittent contact modes. Maximum sample diameter is 16 mm, and custom mounts for larger samples can be provided.


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GLOSSARY
scanning probe microscope
See atomic force microscope; magnetic force microscope; near-field scanning optical microscope; scanning tunneling microscope.
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