Jul 2004Axometrics Inc.Request Info
Axometrics Inc. has introduced two options for its AxoScan family of polarimeters. The out-of-plane measurement fixture rotates and tilts a sample to quickly and automatically measure in- and out-of-plane retardance characteristics of field-of-view-enhancing films for liquid crystal technologies. It also characterizes c-plates and identifies the pretilt angle of transmission liquid crystal cells. The liquid-crystal-on-silicon (LCOS) measurement fixture provides retardance measurements of LCOS devices in retroreflection. An automated X-Y scan table makes uniformity measurements across the aperture of a device, and a variable voltage generator can be integrated for measurements as a function of drive voltage.