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METROLOGY TOOL

Photonics Spectra
Jun 1998
Scientific Computing InternationalRequest Info
 
The FilmTek 2000 is based on Scientific Computing International's new thin-film metrology technology. It combines the ease of use of a fiber optic-based spectrophotometer with material modeling software to provide a reliable tool for simultaneous measurement of film thickness, surface roughness, index of refraction and extinction coefficient. Most translucent films from <25 A to 50 µm can be measured with precision, using a deep-UV to NIR spectrophotometric technology.


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