Jun 2006JEOL USA Inc.Request Info
The JSM-6390/64-90 series high-resolution tungsten scanning electron microscopes, featuring multiple live image displays, a streamlined graphical user interface and low-kilovolt operation, have been announced by JEOL USA Inc. They enable simultaneous observation of up to three images (secondary and backscattered electron and digital camera), on-screen measurement and smart setting. Secondary electron resolution is 3 nm at 30 kV, 8 nm at 3 kV and 15 nm at 1 kV, with magnification of 5× to 300,000×. The series’ five models offer a choice of low-vacuum operation, three stage sizes to accommodate specimens of up to 12 in. and goniometer stage axis control. A variety of sample holders are available.