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MICROSCOPE CONTROL

Photonics Spectra
Aug 2006
Veeco Instruments Inc.Request Info
 
Veeco_Nanscope V NS5_rt03076a.jpgThe NanoScope V extends Veeco Instruments Inc.’s range of scanning probe microscope (SPM) systems. The device achieves reliable high-speed data acquisition of high-density images of 5120 × 5120 pixels. Eight images can be simultaneously captured and displayed, with improved signal-to-noise ratio. With three independent lock-in amplifiers, the controller provides thermal tune measurements of cantilever resonances up to 2 MHz. It affords easy access to most input and output signals through front-panel BNCs and handles data input from an external source. An intuitive graphical interface reduces the initial setup time and engages the sample, adjusts scanning parameters and obtains TappingMode images on most samples with minimal user intervention. Software includes SPM control functions for custom and nanoscale research.


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GLOSSARY
scanning probe microscope
See atomic force microscope; magnetic force microscope; near-field scanning optical microscope; scanning tunneling microscope.
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