Request InfoRudolph Technologies Inc.Metrology systems for measuring thin transparent films have been introduced by Rudolph Technologies Inc. The S3000 (300 mm) and S2000 (200 mm) use proprietary fifth-generation Focus beam ellipsometry technology that incorporates long-life laser light sources for high accuracy, long-term stability, a small spot size and easy tool-to-tool matching. Built on a proprietary Vanguard platform, the systems include a Microsoft Windows XP-based interface. 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