Request InfoVeeco Instruments Inc.Veeco Instruments Inc. has announced a series of enhancements to its Dimension X3D automated atomic force microscope. The upgrades include improvements to critical-dimension precision, 3-D profile metrology and line edge roughness metrology. The device’s depth metrology also has been enhanced with low-wear probe designs, such as carbon nanotubes, to improve lifetimes and the ability to measure smaller features such as nanoimprint masks.See full productRelated content from Photonics MediaPRODUCTSPromoted Content March 2024 IssueMadAFM™ sample scanning AFMThe MadAFM™ is a new multimodal sample scanning AFM. Simple to install with compact tabletop design. 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