Request InfoVeeco Instruments Inc.The Wyko SP9900 surface-profiling system from Veeco Instruments Inc. performs measurements that support high yield and device reliability for high-density interconnect packages. The optical metrology system for semiconductor packaging inspection monitors parameters in multilayer organic panels manufactured for flip-chip pin-grid-array and ball-grid-array packages. Extending the capabilities of the Wyko SP family, it delivers faster measurements, increased sample access and the ability to measure panel sizes up to 600 × 600 mm, all with the same footprint as previous devices. Measurements...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra August 2023 IssueSemiconductor Metrology ToolThe FRT MicroProf® PT from FormFactor Inc. is a metrology and inspection system for high-throughput panel measurement in advanced packaging. 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The paper asks questions to help guide the reader in...Photonics.com 5/30/2023The S-Series | SRThe new general purpose interferometer. Fizeau interferometer for surface and wavefront metrology. 1-Megapixel imaging and 4 optical sources.Photonics.com 1/10/2024Spectral, Spatial and Temporal Optimization of Solid-State Light Engine OutputSpecifications for illumination systems for biomedical imaging and industrial metrology generally converge on spectral, spatial and temporal light output characteristics. This article describes some...WEBINARSPhotonics.com 11/15/2023Selecting the Right Metrology Tool when Weighing Factors Such as Part Access, Surface Quality and Geometry LimitationsRecent years have seen a growth of 3D optical metrology tools able to map objects, some big like buildings and others small like microbes. 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