Jan 2008PhaseViewRequest Info
PhaseView USA has announced new features on its optical devices that are used for 3-D surface measurement. The MicroPhase and SurPhase models now integrate color visualization and processing for better default discrimination and 3-D analysis. The extended dynamic range permits a large Z-measurement scale while maintaining high precision. The new hardware design enables 3-D measurement not only on the microscopic scale but also in the macroscopic mode for large samples. The software interface includes new 3-D measurement functions. Based on proprietary and patented digital phase technology, and relying on fully digital algorithms, the devices measure profile, height, roughness and waviness parameters.