Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
SPECIAL ANNOUNCEMENT
2016 Photonics Buyers' Guide Clearance! – Use Coupon Code FC16 to save 60%!
share
Email Facebook Twitter Google+ LinkedIn

NEAR-IR MEASUREMENT

Photonics Spectra
Mar 2008
getAMORequest Info
 
Sentronic GmbH/getSys has released the getAlyser NIR 1.7 for near-IR measurements and spectroscopic analysis. It performs contact-free component and property analysis on powders, granulates and compounds. Substrate samples in a rotating dish are analyzed optically, with results displayed graphically within minutes via a USB interface and included software. The unit has an integrated Peltier-cooled InGaAs detector, a reflection measurement head for diffuse reflections, a durable tungsten halogen source and a turntable to increase the measurement spot size. The compact device weighs about 4 kg and is 36 cm high. It is suited for quality control applications such as raw material and product identification, enhanced food analysis, analysis of mixed herbs and determination of the OH number in polymeric granulates.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required
Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2016 Photonics Media
x Subscribe to Photonics Spectra magazine - FREE!