Sentronic GmbH/getSys has released the getAlyser NIR 1.7 for near-IR measurements and spectroscopic analysis. It performs contact-free component and property analysis on powders, granulates and compounds. Substrate samples in a rotating dish are analyzed optically, with results displayed graphically within minutes via a USB interface and included software. The unit has an integrated Peltier-cooled InGaAs detector, a reflection measurement head for diffuse reflections, a durable tungsten halogen source and a turntable to increase the measurement spot size. The compact device weighs about 4 kg and is 36 cm high. It is suited for quality control applications such as raw material and product identification, enhanced food analysis, analysis of mixed herbs and determination of the OH number in polymeric granulates.