Request InfoVeeco Instruments Inc.Veeco Instruments Inc. has unveiled the Dimension Icon atomic force microscope (AFM). Its closed-loop head scans at high speeds and delivers low drift and low noise, decreasing stabilization times and allowing the system to acquire artifact-free data quickly. The high-resolution camera and integrated feedback alignment tools provide fast probe positioning and sample navigation, enabling users to locate features of interest more easily. The redesigned software offers an intuitive work flow and default experiment modes that distill advanced AFM processes into preconfigured settings.See full productRelated content from Photonics MediaPRODUCTSPhotonics Showcase October 2022 IssueNano-F: Lens NanopositionersCompact piezo lens nanopositioners with closed-loop control and travel ranges up to 200 μm. Designed to hold and move objective lenses with very low off-axis motion and subnanometer precision. 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