The LEI 1605 mobility tester from Lehighton Electronics Inc. is for use in semiconductor and solar manufacturing processes. It manually measures electron mobility through a nondestructive and contactless method on a variety of substrates and materials. It performs critical and accurate process control measurements in situ. Researchers can measure electron mobility after each epitaxial layer deposition to monitor specific stages of process control. The tester has mapping capability, and it allows repeated reuse of wafers.