The NT9080, a surface metrology system introduced by Veeco Instruments Inc., uses white-light interferometry to measure surface topography nondestructively, from nanometer-scale roughness through millimeter-scale steps, with subnanometer vertical resolution and production-level throughput. Push-button analysis provides instant feedback, and 3-D surface data is saved for subsequent characterization, without requiring a new scan of the sample or part. The system is used in research labs and in the precision machining, medical, printing and solar cell manufacturing markets. With a small footprint, the 3-D measurement microscope accommodates a variety of samples and feature sizes as small as 0.50 μm. Running on Vision software, it provides access to more than 200 distinct analyses and more than 1000 critical parameters for measuring curvature, lay, bearing ratio, wear and corrosion. Long-lifetime green and white LEDs provide the light source.