JPK Instruments AG has released the NanoWizard II, suitable for high-resolution imaging, force spectroscopy and nanomanipulation/lithography. It has a custom-made scanning system with capacitive sensors for high-performance closed-loop atomic force microscopy (AFM). The system provides easy and safe operation under liquid conditions, with a variety of fluid cells, an electrochemistry cell, temperature-control options, and improved AFM head vapor and liquid protection. It has a patent-pending Direct Overlay function that integrates optical imaging with AFM measurements. It also has updated control electronics with low-noise circuitry, proven eight-channel data acquisition, easy access to all major signals and software with several new features.