- Film Thickness/Index Measurement
Sep 2010Metricon Corp.Request Info
The Model 2010/M prism coupler accurately measures thickness (±0.5%)
and index (±0.0002) of thin films, index and birefringence of bulk materials, and
mode indices, index gradients and loss for optical waveguides. Measurable materials
include dielectrics, polymers, some semiconductors, SPR layers and liquids. Flexible
samples are also measurable. Wavelengths from 405 to 1550 nm and measurement of
dn/dT are also available.